TGV Through Hole Glass Substrate Inspection Device
The optimal imaging inspection device for TGV inspection has been completed!
By using high-resolution 2D and 3D cameras, and combining them with NIR (near-infrared), we have achieved the detection of all types of defects. In addition to conventional high-precision surface inspection, it is now possible to measure internal defects and depth using NIR. Furthermore, the range of compatible materials has expanded beyond just glass to include SiC/silicon wafers, ABF films, and more. Please feel free to contact us.
- Company：ニデックアドバンステクノロジー 本社、東京営業所、名古屋営業所
- Price：Other
